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LFA 447 NanoFlash® - Xenon Flash Apparatus

Thermal diffusivity measurements - made easy

 

LFA 447 NanoFlash® - Technical Specifications (subject to change)

  • Temperature range: RT ... 300°C
  • Xenon-Flash-Lamp 10 J/pulse, (adjustable power)
  • Contactless measurement of temperature rise with IR detector
  • Measuring range: 0.01 mm2/s ... 1000 mm2/s (thermal diffusivity)
  • Measuring range: < 0.1 W/mK ... 2000 W/mK (thermal conductivity)
  • Sample dimensions: 10 mm ... 25.4 mm diameter (also 8x8 mm and 10x10 mm, square) 0.1 mm ... 3 mm thickness
  • Sample support for 4 samples
  • Sample holder: metal
  • Sample holder for liquids: aluminum / platinum
  • Atmospheres: air, static
  • MTX Scanning device for 50 mm x 50 mm samples (RT), local resolution 0.1 mm


Schematic of LFA 447 NanoFlash®

 

 

NETZSCH offers instruments for thermal analysis, thermal properties measurement, thermal hazard screening, and contract testing services. Our portfolio is the world's broadest, including a full range of dilatometers to measure high accuracy thermal expansion, classical DSC & TGA, high temperature DSC to 1650°C for specific heat, very high temperature STA (TGA-DSC/DTA) from sub-ambient to 2400°, thermal / evolved gas analysis with fully-integrated FTIR & MS, high resolution TMA and DMA, plus DEA - dielectric analysis for thermoset cure monitoring. We also feature leading-edge technology for thermal conductivity by guarded hot plate and heat flow meters, laser flash thermal diffusivity measurement, thermal hazard screening via adiabatic reaction calorimetry, as well as refractories testing including HMOR, CIC, and RUL. Finally, we offer advanced software packages including thermokinetics for process modeling and development.

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Last update: 04/22/2009 , Copyright © 2000-2006 NETZSCH-Geraetebau GmbH