Ambient and Elevated
Temperature Testing (up to 300°C)
The
new LFA 447 NanoFlash™ light flash
system makes thermal properties testing fast, easy and affordable.
The NanoFlash™ is the result of NETZSCH and Holometrix Micromet's
passion for engineering excellence and unmatched flash diffusivity application
experience, resulting in an exceptionally powerful tool for measuring thermophysical
properties.
Conforming to ASTM E1461, the Xenon flash lamp based NanoFlash™ uses
optical coupling to heat and read the sample surfaces, eliminating potential
interface thermal resistance, and making accurate measurement of thin samples,
coatings on a substrate and materials in a thin film or sandwich possible.
The NanoFlash™ can test samples both through and in the sample plane
over a diffusivity range covering materials from neat and filled polymers
to diamond.
The NanoFlash™ is fully automated: powerful Windows based software
controls the test temperature, flash lamp firing, and data analysis. The
available automatic sample changer allows the instrument to measure multiple
samples in one test. Each data point normally takes less than five minutes
from the time the furnace reaches the test temperature. The instrument
independently sets the flash power level, pulse width and temperature for
each sample.
Principle
of Operation
User replaceable xenon flash lamps fire a pulse at the sample's lower
surface, while the infrared detector measures the temperature rise of
the sample's top surface. The sophisticated software then determines
the sample's thermal diffusivity.
Specific heat is measured by comparing the actual temperature rise of
the sample to the temperature rise of a reference sample of known specific
heat.
The instrument can measure thermal diffusivity (a) and specific heat
(cp) simultaneously. The software uses these values and the bulk density
(r) to calculate thermal conductivity (l) from the equation:
l=arcp
TECHNICAL
SPECIFICATIONS
Sample Size
1" (25.4mm),
0.5" (12.7mm) diameter, or 8mm square,
up to 0.12" (3mm) thick*
Temperature Range
LFA 447/0
Ambient, or
as controlled by external fluid source
LFA 447/1
Ambient to 200C
LFA 447/2
Ambient to
300C
Thermal Diffusivity
Range
0.001
to 10 cm2/sec
Repeatability
Thermal
Diffusivity:
+/- 3%
Specific
Heat:
+/- 5%
Accuracy
Thermal
Diffusivity:
+/- 5%
Specific
Heat:
+/- 7%
Illumination
Two Xenon
Flash Lamps, User Replaceable
Wavelength:
Wide Spectrum
Pulse Energy:
0-5 J/CM2
Sensor Type
INSb IR Detector
with integral dewar
Utilities
115 or 230V
— 50/60 Hz, 10A
Liquid Nitrogen
- approx. 1l
/8hrs
(Integral dewar detector only)
Dimensions (LxWxH)
24 x 22 x
17 in
NETZSCH
Instruments, Inc. also offers contract thermal testing services and a complete
family of thermal analysis and thermoset cure monitoring instrumentation.
NETZSCH offers
precision thermal analysis instruments including advanced dilatometers (with
a new basic R&D/QC dilatometer),
classical DSC & TGA (with
a new economical DSC), high temperature DSC
to 1650°C for specific heat, very high temperature STA
(TGA-DSC/DTA) to 2400°C (featuring the new STA
409-PC Luxx®), thermal
/ evolved gas analysis with fully-integrated FTIR & MS, plus
high resolution TMA and DMA.
We also feature leading technology for thermal conductivity and diffusivity measurement
as well as refractories testing including HMOR, CIC, and RUL.
